Reliability Test Solutions
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Advanced Parallel Reliability Testers
STAr Scorpio series is advanced and highly parallel testers devloped for advanced Wafer- and package-level reliability tests for HCI, BTI, TDDB, HCE, etc.
  • MOSFET HCI, NBTI and Fast-OTF qualifications
  • EIA/JEDEC compliant precision interconnect reliability test
  • Fast-VTDDB and multi-voltage level VSILC functions
  • Precision per-DUT constant current
  • High voltage, current and power burn-in reliability tester
  • Precision resistance measurement
  • Support precise low and high voltage stress bias
  • For power devices reliability test
  • 2F., No.101, Gongdao 5th Rd., Sec. 2, Hsinchu City 300046, Taiwan
  • Tel : +886-3-5717179