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PRODUCTS
MEMS Probe Card
PRODUCTS > MEMS Probe Card
MEMS Probe Card
STAr has designed and developed MEMS (Micro-Electro-Mechanical Systems) type probe card suitable for testing of highly parallel large-array multi-DUT devices to increase productivity with greatly reduce cost-of-test.
  • World first fine-pitch high current MEMS vertical probe card
  • Enhances test efficiencies and reducing cost-of-tests
  • Wide temperature range and high-speed test
  • 2F., No.101, Gongdao 5th Rd., Sec. 2, Hsinchu City 300046, Taiwan
  • Tel : +886-3-5717179