In semiconductor manufacturing, the performance of metrology tools directly impacts quality and yield. Partnering with key metrology equipment suppliers, STAr aims to provide solutions for advanced process controls, defect analysis and critical structural metrology measurements.
- Laser confocal and White light confocal integration
- Super resolution and full-color observation
- Supports the imaging needs of engineering and production process with advanced technology
- Precise and consistent measurement results
- Supports probe card analysis