RF & Wireless Test Solutions
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RF-AARTS Automated Accelerated Reliability Test System
STAr RF Automated Accelerated Reliability Test Station (AARTS) systems are designed to stress devices with RF, DC, and thermal stimulus in order to evaluate reliability and performance degradation.
RF AARTS systems were designed from inception to include RF stimulus. This turnkey test system includes fully integrated software and hardware used to control a number of independently controlled test positions.
Features and Specifications
  • Different channel capacities supported, including up to 16 independently controlled channels in a 2-bay rack
  • Utilizes innovative test fixtures that operate up to mmWave frequencies and up to 300 degC device baseplate temperature while supporting over two dozen commercially available package types
  • High RF drive level capability (up to 50W per channel)
  • Range of DC bias supply options, from high resolution/low power supplies for small devices (GaAs HBT, SiGe) to 400W per channel for high power RF devices (GaN, LDMOS)
  • Various modulation types supported for application-specific testing (pulsed DC/RF, WCDMA)
  • Supports integration of external characterization instruments, such as Semiconductor Parameter Analyzers


Frequency Band Options
  • 500MHz to 3GHz
  • 1GHz to 4GHz
  • 1GHz to 12GHz
  • 2GHz to 18GHz
  • 26GHz to 40GHz
  • Other mmWave bands supported
  • 2F., No.101, Gongdao 5th Rd., Sec. 2, Hsinchu City 300046, Taiwan
  • Tel : +886-3-5717179