Semiconductor product yield is the utmost priority for all wafer fabrication plant as it represents the viability of a wafer fabrication plant to compete for customers. STAr provides multiple software solutions for wafer fabrication plant to improve yield by reducing errors and enabling advanced data analysis.
- Parametric data analysis
- Group-based to enterprise-wide adoption
- Reliability data analysis
- Graphical interpretation
- Supports multiple parametric test platforms for R&D, wafer acceptance, electrical, and reliability tests
- Numerous visualization and calculation tools
- Analyze complex yield issues that require insight into the full supply chain