STAr Technologies, a leading supplier in semiconductor parametric and reliability test systems, announces that a top semiconductor manufacturer selected the STAr Pluto Series SMU-per-pin tester and took delivery in the first quarter of 2021 to enhance production efficiency and engineering accuracy. The delivery validates that STAr Pluto Series unique capabilities command the attention of the semiconductor test industry.
The STAr Pluto Series is the next generation All-In-One advanced reliability test system covering all reliability requirements including HCI, BTI, OTF, TDDB, EM for both Wafer and Package-Level tests. The key capabilities surpass the competing reliability testers in the market, including the SMU-per-pin architecture with one-microsecond measurement timing and the complete HCI, GOI, and EM all-in-one reliability test qualification capabilities. These capabilities enable the Pluto Series tester to achieve higher test performance and throughput at lower cost-of-test and significantly increase flexible capacity for industry customers.
In addition to supporting the full range of nanometer node processes and device reliability qualifications, the STAr Pluto Series provides the flexibility for users to develop customized test programs and methodologies based on their own unique needs. Either connected to individually controlled micro-oven modules for DUTs at package or module level, or seamlessly integrated with the STAr multi-site wafer-level probe stations to provide per-pin WLR characterization for technology nodes down to 3-nanometer.
“We are pleased to announce the delivery completed after STAr Pluto Series launched in 4th quarter of 2020. Pluto series is the next generation SMU-per-pin test solution and has revolutionized industry reliability test solutions. In the future, STAr will continue to accelerate the effort to optimize test experience and support customers with the best solutions with measurement results and high performance,“ said Dr. Choon-Leong Lou, CEO of STAr Technologies.