STAr Technologies, a leading supplier of semiconductor test probe cards, announces its first public display of MEMS probe card at the 30th SWTest hybrid expo. STAr will exhibit WAT and wafer sort probe cards featuring MEMS technology for reliability test, CMOS sensor test, and fine pitch high-current applications requiring vertical probe technology at SWTest 2021 in San Diego, California, USA, combined with a virtual expo on August 30th to September 1st.
Semiconductor Wafer Test (SWTest) is an annual event combining technical conferences and commercial exhibition targeting the semiconductor test industry. This conference focuses on leading technical topics and provides industry participants the opportunity to share and learn about the latest advances in probe technology and related developments. STAr has been a SWTest sponsor and exhibitor for years in support of expanding its international coverage. The SWTest 2021 hybrid exhibition represents STAr’s first public new probe card exhibition since the COVID-19 pandemic began.
"STAr is committed to probe card technology and development in the past decades. We are always devoted to providing the best probing solutions and test experiences to semiconductor customers. Therefore, we are pleased to participate in the 30th SWTest Expo to introduce our MEMS technology probe cards to global customers," said Dr. Choon-Leong Lou, CEO of STAr Technologies.
STAr's lineup of products at SWTest includes MEMS probe card for reliability test, high-current volume production test, and CMOS sensor test probe card. For more information, please refer to the STAr website at www.STAr-Quest.com
and LinkedIn company page
30th SWTest Expo information is as follows:
Date: August 30th to September 01 st, 2021
Venue: Rancho Bernardo Inn, San Diego, C. A., USA