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News & Events
News
2021/11/29
TEST STAr

STAr Technologies , a leading supplier of semiconductor test probe cards, announces its first public display of MEMS probe card at the 30th SWTest hybrid expo. STAr will exhibit WAT and wafer sort probe cards featuring MEMS technology for reliability test, CMOS sensor test, and fine pitch high-current applications requiring vertical probe technology at SWTest 2021 in San Diego, California, USA, combined with a virtual expo on August 30th to September 1st.

 
STAr Technologies , a leading supplier of semiconductor test probe cards, announces its first public display of MEMS probe card at the 30th SWTest hybrid expo. STAr will exhibit WAT and wafer sort probe cards featuring MEMS technology for reliability test, CMOS sensor test, and fine pitch high-current applications requiring vertical probe technology at SWTest 2021 in San Diego, California, USA, combined with a virtual expo on August 30th to September 1st.
 
 
STAr's lineup of products at SWTest includes MEMS probe card for reliability test, high-current volume production test, and CMOS sensor test probe card. For more information, please refer to the STAr website at www.STAr-Quest.com and LinkedIn company page.

30th SWTest Expo information is as follows:
Date: August 30th to September 01 st, 2021
Venue: Rancho Bernardo Inn, San Diego, C. A., USA

             https://www.swtest.org
  • 2F., No.101, Gongdao 5th Rd., Sec. 2, Hsinchu City 300046, Taiwan
  • Tel : +886-3-5717179