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SOLUTIONS
Reliability Test Solutions
SOLUTIONS > Reliability Test Solutions > Advanced Parallel Reliability Testers > Scorpio HCI/BTI/GOI/TDDB Wafer-Level Reliability Tester
Scorpio HCI/BTI/GOI/TDDB Wafer-Level Reliability Tester
Scorpio HCI/BTI/GBI/TDDB Wafer Level Reliability Tester additional Fast-VTDDB and multi-voltage level VSILC functions allow continuous stress bias with short interval monitoring for high resolution time-to-breakdown for WLR applications.
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